The performance of switching devices has a great impact on the operating frequency and loss of power electronic circuits. Therefore, the working characteristics of the device are needed to be tested by double pulse test. However, the traditional double pulse test circuit has some disadvantages, such as high requirements for power drive capability, high cost and poor safety. Therefore, referring to the working principle of the Marx impulse voltage generator, this paper designs a double pulse test circuit platform with low charging requirements, low cost and good security. This paper verifies the reliability of the test platform by testing a GaN switching devices.

Switching device,Double pulse test,Marx generator,GaN Half-Bridge,Miller effect